Cryo-Electron Microscopy Facility
JEOL JEM-3200FS
Field Emission Energy Filter Electron Microscope
Location: CCSB G.0920
About
The JEM-3200FS Field Emission Electron Microscope is equipped with a field emission electron gun of 300 kV accelerating voltage and an in-column energy filter.Features
- In-column energy filter (Omega filter)
- New control systems - systemizing basic functions such as the elctron gun, electron optical system, gonimeter, and evacuation system
- New Systemized goniometer with piezoelectric driving elements - improvement in specimen shift at high magnifications
Workspace
User interface and image screens for the programming of operations and central control of attachments on Windows workstation.
Funding: Instrument funded by the National Science Foundation
Information
Contacts:
Dr. Ricardo Bernal
rbernal@utep.edu
Office: (915) 747-6918
Dr. Marco Ramirez
maramirezramos@utep.edu
Office: (915) 747-7552